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By Jian Min Zuo, John C.H. Spence

This quantity expands and updates the insurance within the authors' well known 1992 publication, Electron Microdiffraction. because the identify implies, the point of interest of the booklet has replaced from electron microdiffraction and convergent beam electron diffraction to all types of complex transmission electron microscopy. specified consciousness is given to electron diffraction and imaging, together with high-resolution TEM and STEM imaging, and the applying of those the way to crystals, their defects, and nanostructures. The authoritative textual content summarizes and develops many of the priceless wisdom which has been won through the years from the research of the a number of electron scattering challenge, the new improvement of aberration correctors and their purposes to fabrics constitution characterization, in addition to the authors' wide instructing adventure in those parts. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is perfect to be used as a sophisticated undergraduate or graduate point textual content in aid after all fabrics in fabrics technology, Physics or Chemistry departments.

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16) reduces to À 1 2 2mE r / ¼ 2 / ¼ k 2 /; 4p2 h ð2:17Þ pffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi where k ¼ 2mE=h2 . 17) is then the same wave equation as in Eq. 9) for a single frequency. This equivalence enables us to apply our accumulated knowledge about waves from other fields, such as optics, to understand electron imaging and diffraction, while the specific quantum-mechanical wave properties of electrons are discussed in reference to electron-specimen interaction. 3 The Principle of Wave Superposition The wave equation, in both the classical and quantum mechanical forms (Eqs.

Modern commercial TEM/STEM instruments offer various options for analytical TEMs, combined TEM/STEM instruments, and dedicated STEMs, as shown in Fig. 6. These instruments share some common features as well as having unique features. 7 shows a schematic diagram of the common features found in a modern analytical TEM/STEM. The microscope is shown to be configured with a Cs probe corrector for high-resolution STEM and an electron biprism for electron holography. Inside the microscope column, we have three optical systems: (1) the illumination system, (2) the objective lens, and (3) the projection system; each can be configured to serve multiple functions in a TEM or STEM mode of operation.

Among the 4 cases above, cases 1 and 3, where the intensity of the total wave is simply the sum of the individual waves, are said to be incoherent. Case 2 is said to be coherent. Here, the intensity of the sum of two waves is the sum of individual wave intensities plus their interference effect, which depends on the relative phase difference between the two waves (An example of electron interference is shown in Fig. ) This interference effect is missing in the incoherent cases. The above discussion was concerned with two opposite cases, one fully incoherent and the other fully coherent.

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